HBM

An excerpt from Terry Welsher’s InCompliance article titled – The “Real” Cost of ESD Damage about using “split lot” experiments to determine the effectiveness of ESD control when manufacturing electronics. “At the time of the first EOS/ESD symposium in 1979 there were few mature ESD programs, but many companies were trying to establish them. Some of…

Read more Early Split-lot Experiments Helped Prove the Need for ESD Control Programs

Damage visible using Scanning Electron Micrograph (SEM) after significant enhancement by delayering and etch enhancement. Used with permission of Hi-Rel Laboratories, Inc. Spokane WA 99217 – http://www.hrlabs.com Photo of ESD arcing from finger to component. This is not a computer simulation. Technician was connected to a small magneto. This is not HBM-ESD. Extensive damage on…

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HUMAN BODY MODEL The updated standard ANSI/ESDA/JEDEC JS-001-2011, For Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) – Component Level Table 3 has divided the Class 0 classification into two withstand voltage levels with class 0A being less than 125 volt sensitivity, and class 0B being 125 to less than 250 volts. If handling class…

Read more What is Human Body Model Class 0A?

Seeing ElectroStatic Discharge (ESD) damage is basically impossible. Damage to semiconductor device structure is NOT visible at ordinary magnifications of an optical microscope. If the microscope is capable of 1000X-1500X magnifications, you just might be able to “see” something. The method used, only occasionally as there is considerable expense, is by delayering and etch enhancement…

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