SEM

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Damage visible using Scanning Electron Micrograph (SEM) after significant enhancement by delayering and etch enhancement. Used with permission of Hi-Rel Laboratories, Inc. Spokane WA 99217 – http://www.hrlabs.com Photo of ESD arcing from finger to component. This is not a computer simulation. Technician was connected to a small magneto. This is not HBM-ESD. Extensive damage on…

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Seeing ElectroStatic Discharge (ESD) damage is basically impossible. Damage to semiconductor device structure is NOT visible at ordinary magnifications of an optical microscope. If the microscope is capable of 1000X-1500X magnifications, you just might be able to “see” something. The method used, only occasionally as there is considerable expense, is by delayering and etch enhancement…

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